Technological facilities

  • Scanning Electron Microscopy & X-Rays Microanalysis

  • 3D Digital Microscope

  • X-Rays Microtomography

  • Glow Discharge Optical Emission Spectrometry

  • Vibrational spectrometry

  • X-ray diffraction

  • Non-contact surface topography measurements

  • Laser granulometry

  • Microhardness

  • Differential Scanning Calorimetry (DSC)

  • Salt spray chambers


  • Analyses et surface
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    Foreign Bodies & contaminants



    The analysis of foreign matter enables identification :

    - Of the morphology of contamination,

    - Of the nature of the contamination,

    - Of the source of the contamination,

    The laboratory (CRITT) is COFRAC-accredited for the filtration and removal of foreign bodies.



    Possibilité d’observations d’images à haute résolution avec dimensionnement associé.

    L’analyse par MEB-EDX permet d’identifier la présence des éléments chimiques à partir du béryllium sur tout type d’échantillons : métalliques, minéraux ou organique.

    Observations are possible using high-resolution images with the associated sizing.

    SEM-EDX analysis is used to identify the presence of chemical elements from beryllium on all types of samples: metallic, inorganic or organic.

    FTIR spectrometry analysis coupled with microscopy is used to identify the origin of an organic particle.

    Comparisons with references may be made in order to identify the particles._

    Our technical facilities

    Scanning Electron Microscope (SEM) - X Microanalysis (EDX)

    Hirox - 3D digital microscope


    2 Voie de l’innovation Pharmaparc II 27100 Val de Reuil
    Tél : +33(0) 2 32 25 04 00 - Fax : +33(0) 2 32 25 11 00 mail : info@analyses-surface.com

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