Technological facilities

  • Scanning Electron Microscopy & X-Rays Microanalysis

  • 3D Digital Microscope

  • X-Rays Microtomography

  • Glow Discharge Optical Emission Spectrometry

  • Vibrational spectrometry

  • X-ray diffraction

  • Non-contact surface topography measurements

  • Laser granulometry

  • Microhardness

  • Differential Scanning Calorimetry (DSC)

  • Salt spray chambers


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    Non-contact surface topography measurements



    Principle

    Optosurf interferometric measurement system is based on Michelson’s interferometer principle (interferences between a reference mirror and the sample’s surface).

    The sample is lighted up by a filtered white light source. 50% of the beam is sent on a reference surface (mirror) thanks to a separative slide. The other part lights up the sample’s surface. Reflected beams from the mirror and the sample are combined on the separative surface and interfere.

    Height differences between the sample and the reference create a interference pattern related to the sample’s surface.

    OPTOSURF’s principle

    Those Height differences are recorded and numerically processed so as to reconstruct the surface ( 100 µm²).

    Many processings are available : surface characterization, roughness parameters calculation, distances and heights measurements, 3D and 2D representations, …. This system is particularly dedicated to extra-polished surfaces.

    Equipement

    OPTOSURF measurements station

    Microscope Nikon, Leica
    Light source Halogen lamp 100 Watts
    Detector High resolution CCD detector
    Format 1384x1036 Pixel
    Z resolution < 0,1 nm
    Acquisition time 3-30 sec
    Filters 20 nm &120 nm

    ALTISURF 500 measurements station

    Principle

    A light beam from an halogen lamp (polychromatic white light) passes through an optic fiber and goes to a passive probe. This passive probe has a chromatic aberration lens that divides the beam into monochromatic wavelengths on a z range (300 µm or 3mm, as a function of the probe). As a function of the surface’s relief, some wavelengths are reflected, other don’t. Reflected wavelengths are then interpreted in terms of height.

    Technical characteristics

    - Acquisition maximum speed : 10 mm.s-1
    - Probes : 300 µm (resolution 0,01 µm) & 3 mm (resolution 0,1 µm)
    - Accuracy : < 0,1 µm / 50 mm
    - Measurements up to an angle of 43°

    Surface treatment processing

    Surface state characterization
    - Normalised 2D and 3D roughness parameters calculations
    - Distances, heights, angles and thickness measurements
    - Volume measurements (peaks or valleys)
    - 2D and 3D surface representation

    Applications : surface characterization on all types of supports, tribology, coatings control, defects propagation (ex : cracks, scratches,…), surface planeness, manufacturing control, etc.


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    Tél : +33(0) 2 32 25 04 00 - Fax : +33(0) 2 32 25 11 00 mail : info@analyses-surface.com

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