Technological facilities

  • Scanning Electron Microscopy & X-Rays Microanalysis

  • 3D Digital Microscope

  • X-Rays Microtomography

  • Glow Discharge Optical Emission Spectrometry

  • Vibrational spectrometry

  • X-ray diffraction

  • Non-contact surface topography measurements

  • Laser granulometry

  • Microhardness

  • Differential Scanning Calorimetry (DSC)

  • Salt spray chambers


  • Analyses et surface
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    Reliability of electronic components


    THE RELIABILITY OF ELECTRONIC COMPONENTS: Determining the cause of a failure in an electronic component


    Finding a defect on a chip card and its components can be very long and difficult due to the size of the various existing electronic components. The occurrence of a fault even within a component can make its characterization difficult because of its size and the ability to disassemble it. Industrialists must be able to carry out the investigations required to solve the problem in order to understand the origin of the short circuit.

    Our facilities allow us to locate the fault using destructive or non-destructive methods.

    The observations and characterizations we perform allow us to:

    Precisely locate the fault (even within an electronic component) by determining the shape and dimensions;

    • To analyze the surface or cross-sectional defect by optical and electron microscopy, to perform elemental analysis to identify the cause of the failure.

    Application examples :

    Analysis of a defect within a thermistor
    Highlighting the defect by X-ray microtomography

    Localisation du corps étranger au niveau de la thermistance Plan d observation

    Characterization of the defect by elemental analysis

    Cliché du plan d observation par microscopie électronique

    Our technical facilities

    [X-ray microtomography

    Hirox - 3D digital microscope

    Scanning electron microscope (SEM)


    2 Voie de l’innovation Pharmaparc II 27100 Val de Reuil
    Tél : +33(0) 2 32 25 04 00 - Fax : +33(0) 2 32 25 11 00 mail : info@analyses-surface.com

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