Technological facilities

  • Scanning Electron Microscopy & X-Rays Microanalysis

  • 3D Digital Microscope

  • X-Rays Microtomography

  • Glow Discharge Optical Emission Spectrometry

  • Vibrational spectrometry

  • X-ray diffraction

  • Non-contact surface topography measurements

  • Laser granulometry

  • Microhardness

  • Differential Scanning Calorimetry (DSC)

  • Salt spray chambers


  • Analyses et surface
    FrançaisEnglish WHO WE ARE QUALITY & CERTIFICATIONS RESEARCH AND INNOVATION IN THE NEWS CONTACT DOWNLOAD
    Skills

    Nos moyens techniques
    Our References
    Scanning Electron Microscopy & X-Rays Microanalysis


    This equipment can quickly provide information on the morphology and elemental composition of a solid object. Its great ease of use, flexibility for viewing highly variable extension fields on massive samples, and the extent of its depth of field make SEM a vital tool in the exploration of the microscopic world.


    It consists of two coupled devices:

    - The SEM : an electron microscopy technique based on the principle of electron-matter interactions, capable of producing high resolution images of the surface of a sample.

    - The X-Rays microanalysis : the EDX detector receives photons emitted by the material due to electronic excitation, and sorts them according to their energy. Each energy value being characteristic of the energy level of a chemical element, it is possible to identify the elements contained in the material.

    This technique provides information that is simultaneously morphological (images) and chemical (elemental composition) of a sample.

    Apparatus:

    HITACHI S3000N Variable Pressure Scanning Electronic Microscope :
     
    - Magnification up to x100,000
    - Variable pressure -> No metallization on non-conductive samples
    - Peltier plate: freezing of organic samples at -30 ° C for non-destructive observation
    - Two image types: topographic contrast (SE mode)
    - chemical contrast (BSE mode)

    EDX detector UltraDry, Thermo Electron :

    - Si Crystal, NORVAR window
    - Detection from beryllium
    - Energy resolution: 132 eV on the K ray (Mn)
    - Spatial resolution: 1 µm3


    2 Voie de l’innovation Pharmaparc II 27100 Val de Reuil
    Tél : +33(0) 2 32 25 04 00 - Fax : +33(0) 2 32 25 11 00 mail : info@analyses-surface.com

    Contact - imprint - ©2014