X-ray diffraction

Articles

• Crystallographic characterization
  17 June 2015, by Administrateur

  CRYSTALLOGRAPHIC CHARACTERIZATION: From the identification of crystallographic forms to the quantitative determination of crystalline compounds
  Solids adopt naturally or not a crystallographic structure that can be used to determine certain characteristics in terms of formulation or performance. The properties (chemical, mechanical, etc.) of the materials are related to their crystallographic structure (s). X-ray diffraction is the essential technique for the crystallographic (...)

• X-ray diffraction
  10 December 2009, by Administrateur

  Principle
  The sample is mounted on a goniometer and gradually rotates while being bombarded with X-rays, producing a diffraction pattern of regularly spaced spots known as diffractions.
  The diffracted beams add constructively in a few specific directions, determined by Bragg’s law:
  - n. = 2.d.sin ø
  Here d is the spacing between diffracting planes, θ is the incident angle, n is any integer, and λ is the wavelength of the beam. These specific directions appear as spots on the (...)